Description
XAN 250 FISCHER
Common Process for Testing
DETAILS :
Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement
FEATURES
- Universal premium instrument with comprehensive measurement capabilities
- Aperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeable
- With high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elements
- Measuring direction from bottom to top, this allows for quick and easy sample positioning
TYPICAL FIELDS OF APPLICATION
- Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
- Trace analysis for consumer protection, e.g. lead content in toys
- Analysis of alloys with highest requirements of accuracy in the jewelry and watch industries and in metal refineries
- Research in universities and in the industries
| Specification | XAN 250 |
|---|---|
| External dimensions W x D x H [mm/in] |
403 x 588 x 365 / 16 x 23.2 x 14.4 |
| Weight [kg/lb] | approx. 45/99 |
| X-Ray Source | |
| X-ray tube | Micro-focus tungsten tube with beryllium window |
| High voltage, three steps [kV] | 10, 30, 50 |
| Aperture (Collimator) Ø [mm/mils] |
0.2/7.9;Â 0.6/23.6; 1.0/39.4;Â 2.0/78.7 |
| Smallest measurement spot Ø [mm/mils] | Approx. 0.3/11.8 |
| X-Ray Detection | |
| Detector type | Silicon Drift Detector (SDD), peltier-cooled |
| Resolution fwhm for Mn-Kα [eV] | ≤ 160 |
| Element range | S (16) to U (92) |
| Repeatability for gold, measurement time 60 sec |
≤ 0,5 ‰ with aperture 1.0 mm |
| Usable sample placement area [mm/in] | 310 x 320 / 12.2 x 12.6 |
| Max. sample height [mm/in] | 90/3.5 |
